尼康工业显微镜LV150可做相差荧光DIC观察
尼康工业显微镜LV150可做相差荧光DIC观察
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北京冠普佳——中国的尼康光学仪器、奥林巴斯显微镜、徕卡显微镜等专业供应
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Industrial Microscope ECLIPSE LV150N (episcopic; manual type)
Digital imaging combined with advanced optical system
Modularized microscope body applicable with various observations and tasks Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body Easy digital imaging ECLIPSE LV150NL with LED illumination
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
It supports diverse and advanced research, analysis and inspection.
| Brightfield | Darkfield | DIC | Fluorescence | Polarizing | Phase contrast | Two-beam interferometry |
|---|---|---|---|---|---|---|
 | | | | | — | |
Objectives for brightfield observation (epi)
CFI60-2 series offers higher NA and longer working distances than ever before.
For more information, see the chartBack to topEasy digital imaging
Through the combination of the Intelligent Nosepiece LV-NU5I and Nosepiece Adapter LV-INAD, information
An environmentally friendly version of the LV150NL which consumes less power through long-life LED illumination is also available.